Surface Photovoltage Measurement | Photoconductive Testing

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Surface Photovoltage Measurement System

Used for the characterization of semiconductors

The surface photovoltage is primarily utilized for semiconductor charge separation and transfer processes induced by light, enabling spectral band interpretation of semiconductors. It provides a feasible method for studying photo-sensitive processes and light-induced interface charge transfer processes in heterostructures.

Features

Modular design tailored to user needs, offering economic flexibility, wide applicability, and easy upgrades, modifications, and maintenance.
Optional high-power halogen and xenon lamp light sources, or compatibility with existing or user-specified light sources.
Spectral system ensures excellent wavelength accuracy and repeatability, minimizing the impact of multi-level spectra and reducing stray light.
Exceptional signal processing capability for both strong and weak signals, effectively improving signal-to-noise ratio and ensuring measurement accuracy.
Multiple sample holders available for convenient handling, ensuring good electrode contact and minimal interference during testing of weak signals.
Comprehensive dedicated software for full automation.

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Surface Photovoltage Measurement System