The 7-SCSpec utilizes a modular concept, allowing the testing system to be configured according to users' specific requirements. It is capable of testing spectral response, spectral reflectance, internal quantum efficiency (IQE) or monochromatic incident photon-to-electron conversion efficiency (IPCE), spectral transmissivity, and short-circuit current density for various types of cells, including thin-film solar cells with single junctions, double junctions, and multi-junctions of monocrystalline or polycrystalline silicon.

Solar simulators replicate standard sunlight for various applications, commonly used in photovoltaic testing. Paired with data collection and processing equipment, they measure solar cell electrical parameters, providing insights into cell performance. Additionally, they serve as light sources for a range of instruments in physics, biochemistry, medicine, environmental studies, and other laboratory experiments.

The test of the I-V characteristics of solar cells refers to the relationship curve between the current output to the load and the voltage across the terminals under certain illumination. The I-V characteristics can fully reflect the conversion efficiency of solar cells, thus obtaining the final performance index of the solar cells, providing the basis for the production of components and determining the price.

The solar cell I-V test station with temperature control offers versatility beyond solar simulator integration, extending its utility to QE/IPCE testing. Its advanced design includes features such as a high-precision positioning sliding mechanism, semiconductor temperature control platform, and standard solar cell holder, ensuring precise measurements and flexibility for various testing needs.

Detectors are optical transducers made of materials exhibiting photoelectric effects. Given the diverse spectral selectivity of materials, testing the spectral response of detectors holds significant importance across production, inspection, application, and research.

The 7-PLSpec photoluminescence measurement system is indispensable for material and semiconductor research. It accurately measures the photoluminescence spectra of semiconductor materials or other luminescent materials (such as GaN, ZnO, CdTe, or certain composite films) under laser excitation.

The performance of our fluorescence measurement system is typically assessed using the signal-to-noise ratio of pure water Raman. When tested using modulation methods, the Raman spectra of pure water are displayed as follows. Equipped with specialized fluorescence testing software, our system can measure excitation spectra, emission spectra, and synchronous spectra with precision and ease.

Our emission measurement system is versatile, capable of measuring the performance of emission spectra from various light sources including LEDs, LCDs, and other luminous bodies.