Detectors are optical transducers made of materials exhibiting photoelectric effects. Given the diverse spectral selectivity of materials, testing the spectral response of detectors holds significant importance across production, inspection, application, and research.

The 7-PLSpec photoluminescence measurement system is indispensable for material and semiconductor research. It accurately measures the photoluminescence spectra of semiconductor materials or other luminescent materials (such as GaN, ZnO, CdTe, or certain composite films) under laser excitation.

The performance of our fluorescence measurement system is typically assessed using the signal-to-noise ratio of pure water Raman. When tested using modulation methods, the Raman spectra of pure water are displayed as follows. Equipped with specialized fluorescence testing software, our system can measure excitation spectra, emission spectra, and synchronous spectra with precision and ease.

Our emission measurement system is versatile, capable of measuring the performance of emission spectra from various light sources including LEDs, LCDs, and other luminous bodies.

The 7-TRASpec transmission, reflectance, and absorption measurement system can test the transmission, reflection, and absorption spectra of flat optical components such as prisms, filters, gratings, coatings, and various materials including solutions and glass.

Unlocking the power of raman spectrum, our system not only enables qualitative analysis but also facilitates quantitative assessment of substances. By integrating notch filter technology, our raman measurement system eliminates the need for precise angle phase adjustments, streamlining operations and enhancing convenience in spectral analysis.

Our CCD measurement system, also known as CCD imaging electronics test equipment for quantitative photoelectric testing, is essential for assessing optoelectronic performance. It addresses critical needs in the development of space optical remote sensors, aiding in the selection of photoelectric imaging devices and providing solutions for radiation hardening and correction.

The surface photovoltage is primarily utilized for semiconductor charge separation and transfer processes induced by light, enabling spectral band interpretation of semiconductors. It provides a feasible method for studying photo-sensitive processes and light-induced interface charge transfer processes in heterostructures.