Optical measurement systems
Optical measurement systems for solar cell testing and optoelectronics testing
The 7-PLSpec photoluminescence measurement system is indispensable for material and semiconductor research. It accurately measures the photoluminescence spectra of semiconductor materials or other luminescent materials (such as GaN, ZnO, CdTe, or certain composite films) under laser excitation. This enables analysis of material band characteristics and is essential for material and semiconductor research.
| Spectral range | Selectable within 200 to 2500nm |
| Wavelength accuracy | ±0.2nm |
| Spectral resolution | ±0.1nm |
| Spectral bandwidth | Adjustable from 0.2 to 10nm |
| Light source wavelength | Optional wavelengths including 224nm, 248nm, 266nm, 325nm, 488nm, 532nm, etc. |
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