Optical measurement systems
Optical measurement systems for solar cell testing and optoelectronics testing
The 7-SCSpec utilizes a modular concept, allowing the testing system to be configured according to users' specific requirements. It is capable of testing spectral response, spectral reflectance, internal quantum efficiency (IQE) or monochromatic incident photon-to-electron conversion efficiency (IPCE), spectral transmissivity, and short-circuit current density for various types of cells, including thin-film solar cells with single junctions, double junctions, and multi-junctions of monocrystalline or polycrystalline silicon.
| Spectrum range | 200-2500nm (optional) |
| Scanning interval | ≥1nm (adjustable integer) |
| Scanning mode | Fully automatic operation |
| Configurable with two bias light sources, convenient for testing thin film solar cells with over 3 junctions | |
| Bias filters | Seven pieces, including two short-wave pass (imported) and four long-wave pass |
| Repeatability of short-circuit current density | < 0.1%-0.5% (slightly varies depending on the light source and spectral range) |
| Working table with optional temperature control | Temperature range of 5-40 ℃ (± 0.5 ℃) |
| Test methods | AC, DC (optional) |
| Optional three automatic shutters, each controlling the main light and the opening and closing of two polarization switches | |
| Choice of a double-grating monochromator | |
| Optional dual light path monitoring | |
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